Lab Info

Name X- Ray
Type Service
Supervisor Raanan Avraam
Coordinator Raanan Avraam
Personnel Raanan Avraam
Characterization of thin epitaxial layers is made by using a high resolution X-ray diffractometer. It contains a compact four-crystal monochromator which produces a highly parallel and monochromatic incident beam; divergence being  and wavelength band
X-ray rocking curve measurements give the information about substrate miscut and curvature, epitaxial layer tilt, as well as mismatch and; composition of layers in a state of full or partial strain or relaxation. Layer thicknesses of single layers, as well as periods and mean mismatch  of superlattices in multilayered structures can also be determined.

PHILIPS X-ray - X-Ray

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