Lab Info
 

Name X- Ray
Type Service
Supervisor Raanan Avraam
Coordinator Raanan Avraam
Personnel Raanan Avraam
Description
Characterization of thin epitaxial layers is made by using a high resolution X-ray diffractometer. It contains a compact four-crystal monochromator which produces a highly parallel and monochromatic incident beam; divergence being  and wavelength band
X-ray rocking curve measurements give the information about substrate miscut and curvature, epitaxial layer tilt, as well as mismatch and; composition of layers in a state of full or partial strain or relaxation. Layer thicknesses of single layers, as well as periods and mean mismatch  of superlattices in multilayered structures can also be determined.
Equipment

PHILIPS X-ray - X-Ray

Collaborations
Publications
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