1975-1977 Research Associate at the Department of Inorganic and Analytical Chemistry at the Hebrew University, Jerusalem.
1978-1982 Research Associate at the Solid State Institute, Technion, Haifa.
1983-Today Research Engineer at the Solid State Institute, Technion, Haifa.
High resolution X-ray measurements of rocking curves in thin semiconductor layers and characterization of parameters of single epitaxial layers and multilayered systems (Lab. of High Resolution X-Ray Diffraction Research Project)